News | January 19, 2010

New High Performance Computed Radiography Phosphor Imaging Plates From GE

New Series Complements Existing Comprehensive Range

Berchem, Belgium – With the introduction of a new IPU series of phosphor imaging plates, GE Sensing & Inspection Technologies now provides a comprehensive portfolio of imaging plates covering virtually allnon-destructive testing (NDT) applications for computed radiography. The new IPU plates offer excellent sharpness and the best probability of detection in the GE portfolio, while maintaining the same high level of productivity. They are designed for highly critical, specialist applications involving castings and weld inspection in the aerospace, oil and gas, power generation and automotive sectors.

Steven Wissels, product manager at GE Sensing & Inspection Technologies, explains, "We can now offer our IPC2 plates for standard X-ray and Isotope applications such as on-stream inspection allowing short exposure times or low doses; our IPS plates for applications requiring high image quality in combination with excellent signal-noise ratio (SNR); and our new IPU plates for high-end applications where the demand for small defect recognition is paramount. "

The IPU plates are particularly designed for use with GE's world-class range of Computed Radiography scanning systems. When used with the recently introduced CRxFlex system they feature a basic spatial resolution (BSR) of 50µ, while in combination with the long-established CRxTower the BSR is 65µ.

As one of the leading specialists for phosphor imaging plates, GE continuously strives to improve its product portfolio. The new imaging plate technology in combination with GE scanners, received the industry standard BAM certification and is accepted by the quality control regimes of a number of leading global companies in aerospace, oil and gas and power generation, meets applicable ASME, ASTM and EN standards, and is classified IP Class 1 / Special.

SOURCE: GE Sensing & Inspection Technologies