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Datasheet: Optical Backscatter Reflectometer: Model OBR 4400

Luna Technologies, a Division of Luna Innovations Incorporated
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Description

Luna Technologies' Optical Backscatter Reflectometer: Model OBR 4400 offers unprecedented diagnostic capabilities to designers and manufacturers of fiber optic components and assemblies.

Optical Backscatter Reflectometer: Model OBR 4400 uses swept-wavelength coherent interferometry to measure minute reflections (< 0.0003 parts per billion) in an optical system as a function of length with spatial resolution less than 10 microns. This provides the user with precision reflectometry and unprecedented optical-module inspection and diagnostic capabilities by providing the ability to locate and troubleshoot splices, connectors, fiber bends and breaks, insertion loss points, track polarization, verify PM components and more.

Luna Technologies' Optical Backscatter Reflectometer: Model OBR 4400 takes the industry's first ultra-high resolution OTDR with backscatter-level sensitivity designed for component- and module-level reflectometry to the next level. With a small, easily transportable platform, the capability to "see" reflections out to 2 kilometers with no dead zone, and integrated temperature and strain sensing, the OBR 4400 gives you the ultimate in fiber diagnostics.

ADVANTAGES:

  • High resolution OTDR - Resolve individual features with spatial resolution down to 40 microns.
  • High sensitivity - 70 dB of dynamic range and -130 dB sensitivity.
  • Long range - Measure up to 2000 meters in length with a single connection, single scan.
  • Single Connection IL and RL - Measure insertion and return loss in a single scan.
  • Locate loss events - Monitor backscatter levels to isolate losses due to bends, crimps, bad splices, etc.
  • "Look inside" devices - Use powerful windowing feature to interrogate individual components within a subsystem.
  • Polarization Tracking - Track changes in the state-of-polarization as light propagates through an optical network.
  • Intuitive graphical interface - All key data and graphs in a simple, easy to use interface.
  • Distributed sensing - use standard optical fiber to monitor the changes in temperature and strain

APPLICATIONS:

  • Optical subsystem production and verification for amplifier modules, Tx/Rx circuit packs and line cards, laser and modulator packages.
  • Single connection optical switch verification.
  • Assembly verification including splice and connector location and fidelity management.
  • Full system design verification and analysis that can discriminate between individual devices, connectors, fibers, splices and components.
  • Component qualification - Incoming inspection and rapid testing of individual optical components.
  • Troubleshooting of optical systems and modules during development and production.
  • Failure analysis of devices and subassemblies.
  • Ultra-high resolution OTDR
  • Precision reflectometry

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