Brochure | July 31, 2006

Brochure: MEMS Workstations: Micro-Motion Analysis, Assemble, Test and Repair

Source: Polytec
By combining Polytec's motion analyzer systems with a probe station the user can concentrate on the dynamic test rather than on sample holding, positioning and contact issues already addressed by probe station technology. These solutions were found for the early semiconductor and microbiology applications and are easily adapted to MEMS testing.
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